- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/203 - Measuring back scattering
Patent holdings for IPC class G01N 23/203
Total number of patents in this class: 529
10-year publication summary
39
|
43
|
47
|
34
|
47
|
48
|
55
|
45
|
35
|
10
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
The Boeing Company | 19843 |
53 |
Nuctech Company Limited | 1275 |
37 |
American Science and Engineering, Inc. | 112 |
29 |
Rapiscan Systems, Inc. | 300 |
29 |
Tsinghua University | 5426 |
25 |
FEI Company | 851 |
17 |
ASML Netherlands B.V. | 6816 |
12 |
Troxler Electronic Laboratories, Inc. | 86 |
12 |
Hitachi High-Tech Corporation | 4424 |
11 |
Commissariat à l'énergie atomique et aux energies alternatives | 10525 |
9 |
Oxford Instruments NanoTechnology Tools Limited | 145 |
9 |
Hitachi High-Technologies Corporation | 2034 |
8 |
Bruker Nano GmbH | 63 |
8 |
Visuray Intech Ltd (BVI) | 25 |
8 |
Viken Detection Corporation | 57 |
8 |
Halliburton Energy Services, Inc. | 20165 |
7 |
University of Florida Research Foundation, Inc. | 3883 |
6 |
Shenzhen Xpectvision Technology Co., Ltd. | 359 |
6 |
Loram Technologies, Inc. | 60 |
6 |
Inversa Systems Ltd. | 30 |
5 |
Other owners | 224 |